Texas Instruments SNJ54BCT8244AFK Microcontrollers
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
Same model may have multiple batches, images only for reference.
Manufacturer
Part Number (MPN)
SNJ54BCT8244AFK
Base Model
Detailed Description
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
Lifecycle Status
Active
Datasheet
SNJ54BCT8244AFK Datasheet
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Alternate Parts Comparison (SNJ54BCT8244AFK vs SNJ54BCT374W vs SNJ54BCT541FK vs SNJ54BCT620AJ)
Side-by-side technical parameter comparison of related primary models in this product family.
| This Part | Alternate Parts | Alternate Parts | Alternate Parts | |
|---|---|---|---|---|
| Series | -- | 54BCT | 54BCT | 54BCT |
| Package / Case | -- | 20-CFlatpack | 20-CLCC | 20-CDIP |
| Mounting Type | -- | Surface Mount | Surface Mount | Through Hole |
| Operating Temperature | -- | -55°C ~ 125°C (TA) | -55°C ~ 125°C (TA) | -55°C ~ 125°C (TA) |
| Supply Voltage | -- | 4.5V ~ 5.5V | 4.5V ~ 5.5V | 4.5V ~ 5.5V |
| Current Output High Low | -- | 2mA, 48mA | 12mA, 48mA | 12mA, 48mA |
| Number of Bits Per Element | -- | 8 | 8 | 8 |
| Number of Elements | -- | 1 | 1 | 1 |
| Output Type | -- | Tri-State, Non-Inverted | 3-State | 3-State |
| Logic Type | -- | -- | Buffer, Non-Inverting | Transceiver, Inverting |
| Action |
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