Texas Instruments SN74BCT8373ADW Specialty Logic
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
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Manufacturer
Part Number (MPN)
SN74BCT8373ADW
Series
Detailed Description
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
Package
24-SOIC (0.295", 7.50mm Width)
Lifecycle Status
Active
RoHS State
RoHS Compliant
Datasheet
SN74BCT8373ADW Datasheet
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Technical Specifications
Texas Instruments SN74BCT8373ADW Specialty Logic technical specifications.
General
Series
74BCT
Package / Case
24-SOIC
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 70°C
Supply Voltage
4.5V ~ 5.5V
Lifecycle Status
Active
Number of Bits
8
Logic Type
Scan Test Device with D-Type Latches
Related Parts Comparison (SN74BCT8373ADW vs SN74BCT374NSR vs SN74BCT125ADR vs SN74BCT125ANSR)
Side-by-side specifications of related catalog parts.
Engineering verification required. Related parts may have different electrical ratings, pinouts, footprints, and operating limits. Verify suitability for your circuit before substitution.
| This Part | Related Part | Related Part | Related Part | |
|---|---|---|---|---|
| Package / Case | 24-SOIC | 20-SOIC | 14-SOIC | 14-SOIC |
| Mounting Type | Surface Mount | Surface Mount | Surface Mount | Surface Mount |
| Operating Temperature | 0°C ~ 70°C | 0°C ~ 70°C (TA) | 0°C ~ 70°C (TA) | 0°C ~ 70°C (TA) |
| Supply Voltage | 4.5V ~ 5.5V | 4.5V ~ 5.5V | 4.5V ~ 5.5V | 4.5V ~ 5.5V |
| Lifecycle Status | Active | Active | Active | Active |
| Logic Type | Scan Test Device with D-Type Latches | -- | Buffer, Non-Inverting | Buffer, Non-Inverting |
| Current Output High Low | -- | 15mA, 64mA | 15mA, 64mA | 15mA, 64mA |
| Number of Bits Per Element | -- | 8 | 1 | 1 |
| Number of Elements | -- | 1 | 4 | 4 |
| Output Type | -- | Tri-State, Non-Inverted | 3-State | 3-State |
| Action |
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