Texas Instruments SN74LVTH18646APMG4 Integrated Circuits (ICs)
IC SCAN-TEST-DEV/XCVR 64-LQFP

Same model may have multiple batches, images only for reference.
Manufacturer
Part Number (MPN)
SN74LVTH18646APMG4
Series
Base Model
Detailed Description
IC SCAN-TEST-DEV/XCVR 64-LQFP
Package
64-LQFP
Lifecycle Status
Active
Datasheet
SN74LVTH18646APMG4 Datasheet
Quick Jump:
Technical Specifications
Texas Instruments SN74LVTH18646APMG4 Integrated Circuits (ICs) technical specifications.
General
Series
74LVTH
Package / Case
64-LQFP
Mounting Type
Surface Mount
Operating Temperature
-40°C ~ 85°C
Supply Voltage
2.7V ~ 3.6V
Package
64-LQFP
Number of Bits
18
Logic Type
ABT Scan Test Device With Transceivers and Registers
Base Product Number
74LVTH18646
Alternate Parts Comparison (SN74LVTH18646APMG4 vs SN74LVTH244ADBR vs SN74LVTH574RGYR vs SN74LVTH162374DGGR)
Side-by-side technical parameter comparison of related primary models in this product family.
| This Part | Alternate Parts | Alternate Parts | Alternate Parts | |
|---|---|---|---|---|
| Package / Case | 64-LQFP | -- | 20-VFQFN Exposed Pad | 48-TFSOP |
| Mounting Type | Surface Mount | -- | Surface Mount | Surface Mount |
| Operating Temperature | -40°C ~ 85°C | -- | -40°C ~ 85°C (TA) | -40°C ~ 85°C (TA) |
| Supply Voltage | 2.7V ~ 3.6V | -- | 2.7V ~ 3.6V | 2.7V ~ 3.6V |
| Series | 74LVTH | -- | -- | -- |
| Base Product Number | 74LVTH18646 | -- | -- | -- |
| Logic Type | ABT Scan Test Device With Transceivers and Registers | -- | -- | -- |
| Number of Bits | 18 | -- | -- | -- |
| Package | 64-LQFP | -- | -- | -- |
| Current Output High Low | -- | -- | 32mA, 64mA | 12mA, 12mA |
| Function | -- | -- | Standard | Standard |
| Input Capacitance | -- | -- | 3 pF | 3 pF |
| Action |
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