Texas Instruments SN74BCT8374ADWRE4 Specialty Logic
IC SCAN TEST DEVICE W/FF 24-SOIC
Same model may have multiple batches, images only for reference.
Manufacturer
Part Number (MPN)
SN74BCT8374ADWRE4
Series
Detailed Description
IC SCAN TEST DEVICE W/FF 24-SOIC
Package
24-SOIC (0.295", 7.50mm Width)
Lifecycle Status
Obsolete
RoHS State
RoHS Compliant
Datasheet
SN74BCT8374ADWRE4 Datasheet
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Technical Specifications
Texas Instruments SN74BCT8374ADWRE4 Specialty Logic technical specifications.
General
Package / Case
24-SOIC
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 70°C
Supply Voltage
4.5V ~ 5.5V
Number of Bits
8
Logic Type
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Alternate Parts Comparison (SN74BCT8374ADWRE4 vs SN74BCT374NSR vs SN74BCT125ADR vs SN74BCT125ANSR)
Side-by-side technical parameter comparison of related primary models in this product family.
| This Part | Alternate Parts | Alternate Parts | Alternate Parts | |
|---|---|---|---|---|
| Package / Case | 24-SOIC | 20-SOIC | 14-SOIC | 14-SOIC |
| Mounting Type | Surface Mount | Surface Mount | Surface Mount | Surface Mount |
| Operating Temperature | 0°C ~ 70°C | 0°C ~ 70°C (TA) | 0°C ~ 70°C (TA) | 0°C ~ 70°C (TA) |
| Supply Voltage | 4.5V ~ 5.5V | 4.5V ~ 5.5V | 4.5V ~ 5.5V | 4.5V ~ 5.5V |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops | -- | Buffer, Non-Inverting | Buffer, Non-Inverting |
| Current Output High Low | -- | 15mA, 64mA | 15mA, 64mA | 15mA, 64mA |
| Number of Bits Per Element | -- | 8 | 1 | 1 |
| Number of Elements | -- | 1 | 4 | 4 |
| Output Type | -- | Tri-State, Non-Inverted | 3-State | 3-State |
| Action |
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