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Texas Instruments SN74BCT8373ADW Specialty Logic

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches

8,928 ActiveTexas Instruments74BCT24-SOIC (0.295", 7.50mm Width)RoHS
SN74BCT8373ADW - No Image Available

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SN74BCT8373ADW
Manufacturer
Part Number (MPN)
SN74BCT8373ADW
Series
Detailed Description
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
Package
24-SOIC (0.295", 7.50mm Width)
Lifecycle Status
Active
RoHS State
RoHS Compliant
Datasheet
PDF SN74BCT8373ADW Datasheet
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Technical Specifications

Texas Instruments SN74BCT8373ADW Specialty Logic technical specifications.

General

Series
74BCT
Package / Case
24-SOIC
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 70°C
Supply Voltage
4.5V ~ 5.5V
Number of Bits
8
Logic Type
Scan Test Device with D-Type Latches
Base Product Number
74BCT8373

Alternate Parts Comparison (SN74BCT8373ADW vs SN74BCT374NSR vs SN74BCT125ADR vs SN74BCT125ANSR)

Side-by-side technical parameter comparison of related primary models in this product family.

This PartAlternate PartsAlternate PartsAlternate Parts
Package / Case24-SOIC20-SOIC14-SOIC14-SOIC
Mounting TypeSurface MountSurface MountSurface MountSurface Mount
Operating Temperature0°C ~ 70°C0°C ~ 70°C (TA)0°C ~ 70°C (TA)0°C ~ 70°C (TA)
Supply Voltage4.5V ~ 5.5V4.5V ~ 5.5V4.5V ~ 5.5V4.5V ~ 5.5V
Logic TypeScan Test Device with D-Type Latches--Buffer, Non-InvertingBuffer, Non-Inverting
Current Output High Low--15mA, 64mA15mA, 64mA15mA, 64mA
Number of Bits Per Element--811
Number of Elements--144
Output Type--Tri-State, Non-Inverted3-State3-State
Action

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